Our Research

Pioneering multimodal nanoscale imaging combining chemical, mechanical, and electrical characterization

Core Techniques

PF-KPFM

Pulsed Force Kelvin Probe Force Microscopy achieving <10nm spatial resolution for surface potential mapping.

<10nm spatial resolution
Single-pass AFM scanning
Ambient condition operation
Work function and surface potential mapping
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Core Techniques

PFIR Microscopy

Peak Force Infrared Microscopy enabling simultaneous chemical and mechanical imaging at ~6nm resolution.

Simultaneous chemical and mechanical imaging
~6nm spatial resolution, far beyond diffraction limit
Works in both air and liquid/aqueous phase
Compatible with soft polymers and biological materials
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More Technologies

AFM-2DIR

Action-based time-domain 2D infrared nanospectroscopy bypassing the Abbe diffraction limit.

PF-SNOM

Near-field microscopy leveraging peak force tapping mode for 3D tomographic imaging with ultra-high spatial resolution.

s-SNOM Improvements

Improvements on s-SNOM including 3D response collection, broadband infrared sources, and low repetition rate laser compatibility.

~6nm
Spatial Resolution
5+
Core Techniques
50+
Publications
Multi
Modal Imaging

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Our techniques are applicable to a wide range of materials and research questions. Contact us to discuss how our methods can advance your research.

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