Research

New tools enable scientific discoveries

We develop our own tools for chemical analysis, through innovations with atomic force microscope (AFM) and laser spectroscopy

AFM-based Infrared Microscopy

While the diffraction limit for IR radiation is at the micrometer scale, the radius of curvature of a metal-coated AFM tip can be consistently at the level of a few tens of nanometers. The optical field between the AFM tip and sample often achieves < 10 nm field confinement— serving as a nanometer size light source to perform nano-spectroscopy and super-resolution chemical imaging.

Tip enhancement can be at ~ 10 nm scale, with a commercially available tip with affordable price.

Mapping of Nanoscale Electrical Properties

Our group has also made a contribution to the development of new types of Kelvin Probe Force Microscopy (KPFM), in particular, the Pulsed force KPFM that enable mapping surface potential at ~10 nm spatial resolution under ambient conditions.